Toward Cost-effective Adaptive Random Testing: An Approximate Nearest Neighbor Approach
Rubing Huang,Chenhui Cui,Junlong Lian,Dave Towey,Weifeng Sun,Haibo Chen
DOI: https://doi.org/10.1109/tse.2024.3379592
IF: 7.4
2024-01-01
IEEE Transactions on Software Engineering
Abstract:Adaptive Random Testing (ART) enhances the testing effectiveness (including fault-detection capability) of Random Testing (RT) by increasing the diversity of the random test cases throughout the input domain. Many ART algorithms have been investigated such as Fixed-Size-Candidate-Set ART (FSCS) and Restricted Random Testing (RRT), and have been widely used in many practical applications. Despite its popularity, ART suffers from the problem of high computational costs during test-case generation, especially as the number of test cases increases. Although several strategies have been proposed to enhance the ART testing efficiency, such as the forgetting strategy and the k-dimensional tree strategy, these algorithms still face some challenges, including: (1) Although these algorithms can reduce the computation time, their execution costs are still very high, especially when the number of test cases is large; and (2) To achieve low computational costs, they may sacrifice some fault-detection capability. In this paper, we propose an approach based on Approximate Nearest Neighbors (ANNs), called Locality-Sensitive Hashing ART (LSH-ART). When calculating distances among different test inputs, LSH-ART identifies the approximate (not necessarily exact) nearest neighbors for candidates in an efficient way. LSH-ART attempts to balance ART testing effectiveness and efficiency.
engineering, electrical & electronic,computer science, software engineering