Abstract:Defect localization aims to locate buggy program elements (e.g., buggy files, methods or lines of code) based on defect symptoms, e.g., bug reports or program spectrum. However, when we receive the defect symptoms, the defect has been exposed and negative impacts have been introduced. Thus, one challenging task is: whether we can locate buggy program prior to the appearance of the defect symptom (e.g., when buggy program elements are being committed to a version control system). We refer to this type of defect localization as “Just-In-Time (JIT) Defect localization”. Although many prior studies have proposed various JIT defect identification methods to identify whether a new change is buggy, these prior methods do not locate the suspicious positions. Thus, JIT defect localization is the next step of JIT defect identification (i.e., after a buggy change is identified, suspicious source code lines are located). To address this problem, we propose a two-phase framework, i.e., JIT defect identification and JIT defect localization. Given a new change, JIT defect identification will identify it as buggy change or clean change first. If a new change is identified as buggy, JIT defect localization will rank the source code lines introduced by the new change according to their suspiciousness scores. The source code lines ranked at the top of the list are estimated as the defect location. For JIT defect identification phase, we use 14 change-level features to build a classifier by following existing approach. For JIT defect localization phase, we propose a JIT defect localization approach that leverages software naturalness with the N-gram model. To evaluate the proposed framework, we conduct an empirical study on 14 open source projects with a total of 177,250 changes. The results show that software naturalness is effective for our JIT defect localization. Our model achieves a reasonable performance, and outperforms the two baselines (i.e., random guess and a static bug finder (i.e., PMD)) by a substantial margin in terms of four ranking measures.

SNIAFL: Towards a Static Non-Interactive Approach to Feature Location

Feature Location in Source Code by Trace-Based Impact Analysis and Information Retrieval.

Iterative Context-Aware Feature Location (NIER Track)

Improving Feature Location Using Structural Similarity and Iterative Graph Mapping

Just-In-Time Defect Identification and Localization: A Two-Phase Framework.

An exploratory study of feature location process: Distinct phases, recurring patterns, and elementary actions

Improving Feature Location Practice with Multi-Faceted Interactive Exploration

Reflective Feature Location: Knowledge in Mind Meets Information in System.

Feature Location Method Based on Sub-graph Searching

Contextual Recommendation of Relevant Program Elements in an Interactive Feature Location Process

How developers perform feature location tasks: a human-centric and process-oriented exploratory study.

Towards Interactive Fault Localization Using Test Information

Identifying use cases in source code

Alternative scalable algorithms for lattice-based feature location

Concern Localization Using Information Retrieval: an Empirical Study on Linux Kernel

ALBFL: A Novel Neural Ranking Model for Software Fault Localization Via Combining Static and Dynamic Features

Software reconnaissance: Mapping program features to code

Understanding How the Requirements Are Implemented in Source Code

Analyzing Closeness Of Code Dependencies For Improving Ir-Based Traceability Recovery

Revisit of Automatic Debugging Via Human Focus-Tracking Analysis

IFAttn: Binary Code Similarity Analysis Based on Interpretable Features with Attention