Effect of tunneling frequency on relaxor behavior

Zhongqing Wu,Wenhui Duan,Zhirong Liu,Bing-Lin Gu,Xiao-Wen Zhang
DOI: https://doi.org/10.1016/S0167-9317(02)00982-6
IF: 2.3
2003-01-01
Microelectronic Engineering
Abstract:A main characteristic of typical relaxor ferroelectrics distinguished from normal ferroelectric is the diffuse phase transition (DPT), i.e. the dielectric constant slowly varies nearby the temperature of the dielectric peak. DPT behavior can be well described by a modified Curie-Weiss formula. Dependence of the critical exponent on the tunneling frequency has been investigated with the eight-potential-well order-disorder ferroelectric model. For low tunneling frequency, the ferroelectric phase transition is of second-order and the system conforms to the Curie-Weiss law. The critical exponent departs significantly from the Curie-Weiss value of unity and increases with increasing tunneling frequency at the region of the first-order phase transition, which is a typical diffuse phase transition behavior. Our work is useful for understanding the phenomena that some normal ferroelectrics show pressure-induced crossover from normal ferroelectric to relaxor.
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