Atomic Defect Quantification by Lateral Force Microscopy
Yucheng Yang,Kaikui Xu,Luke N. Holtzman,Kristyna Yang,Kenji Watanabe,Takashi Taniguchi,James Hone,Katayun Barmak,Matthew R. Rosenberger
DOI: https://doi.org/10.1021/acsnano.3c07405
IF: 17.1
2024-02-23
ACS Nano
Abstract:Atomic defects in two-dimensional (2D) materials impact electronic and optoelectronic properties, such as doping and single photon emission. An understanding of defect-property relationships is essential for optimizing material performance. However, progress in understanding these critical relationships is hindered by a lack of straightforward approaches for accurate, precise, and reliable defect quantification on the nanoscale, especially for insulating materials. Here, we demonstrate that...
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology