Spectromicroscopy and imaging of photoexcited electron dynamics at in-plane silicon pn junctions

Aiqin Hu,Wei Liu,Xiaofang Li,Shengnan Xu,Yaolong Li,Zhaohang Xue,Jinglin Tang,Lulu Ye,Hong Yang,Ming Li,Yu Ye,Quan Sun,Qihuang Gong,Guowei Lu
DOI: https://doi.org/10.1039/d0nr07954e
IF: 6.7
2021-01-01
Nanoscale
Abstract:Revealing the influence of doping patterns on the photoelectron spectra and dynamics at in-plane silicon PN junctions using a time-resolved photoemission electron microscope.
materials science, multidisciplinary,physics, applied,nanoscience & nanotechnology,chemistry
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