Detecting diabetic retinopathy using a hybrid ensemble XL machine model with dual weighted-Kernel ELM and improved mayfly optimization
Anitha Kannan,ShanmugaPrabha Palanivel,SashiRekha Karthikeyan,VigilsonPrem Mholds,JeganAmarnath Joseph
DOI: https://doi.org/10.1016/j.eswa.2024.124221
IF: 8.5
2024-05-30
Expert Systems with Applications
Abstract:The uncontrolled increase of blood glucose level affects the retina and cause Diabetic Retinopathy (DR), which can permanently damage blood vessels if left untreated for a long time. Early detection helps the patient's to minimize the severity level. However, the existing Synergic Deep Learning (SDL) model for detecting severity levels of fundus DR images lacks proper filtering methods, suffers from low image quality, and improperly tuned hyperparameters. To address these issues, a hybrid ensemble Extreme Learning (XL) machine model is proposed in detection and classification of DR. The proposed model includes preprocessing steps, such as image filtering, conversion, segmentation, and morphological operations, to improve image quality. Also the parameters are tuned effectively and the weight functions are analyzed based on the extracted features that lower the blurriness of the images. A Dual Weighted-Kernel Extreme Learning Machine (DW-KELM) is developed to classify DR images with improved accuracy, and an Improved Mayfly Optimization (IMO) algorithm is applied to optimize the DW-KELM model's parameters. Implementing the Weighted Average Ensemble (WAE) technique enhances the model's performance by allocating different weights. Two datasets, namely the SUSTech-SYSU, APTOS-2019 and IDRID datasets, are used for experimentation, and the results revealed that DW-KELM achieved 99% accuracy, with an overall sensitivity, specificity, precision, and F1-score of 98.52%, 96.32%, 98.10%, and 98.52% respectively. The proposed model achieved better performance in classifying 5 DR classes, including moderate DR, Proliferative DR, no DR, severe DR, and mild DR, with good image quality.
computer science, artificial intelligence,engineering, electrical & electronic,operations research & management science