Time-Domain Characterization of Nematic Liquid Crystals Using Additive Manufacturing Microstrip Lines

Pablo Mateos-Ruiz,Mario Pérez-Escribano,Alberto Hernández-Escobar,Elena Abdo-Sánchez,Enrique Márquez-Segura,Teresa M. Martín-Guerrero,Carlos Camacho-Peñalosa
DOI: https://doi.org/10.1109/tim.2024.3413162
IF: 5.6
2024-06-25
IEEE Transactions on Instrumentation and Measurement
Abstract:This article presents a method for effectively characterizing the dielectric permittivity of nematic liquid crystals (LCs) across a broad frequency range. These materials show significant potential for reconfigurable devices operating in microwave and millimeter-wave frequencies. To achieve this goal, an additive manufacturing technique is used to create a microstrip line that can be filled with liquid that acts as its substrate. The LC is then biased to modulate its permittivity. After manufacturing, a time-gating approach is used to extract the permittivity, eliminating the need for in-fixture calibration, such as thru–reflect–line (TRL). Finally, the approach is validated through simulations and experimental results, which closely align with those reported using other methods in the bibliography.
engineering, electrical & electronic,instruments & instrumentation
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