Diagonal Illumination Scheme for Fourier Ptychographic Microscopy: Resolution Doubling and Aliasing Minimization
Yefeng Shu,Jiasong Sun,Yao Fan,Yao Jin,Qian Chen,Chao Zuo
DOI: https://doi.org/10.1364/josaa.532252
2024-01-01
Abstract:Fourier ptychographic microscopy (FPM) is a high-throughput computational imaging technology that enables wide-field and high-resolution imaging of samples with both amplitude and phase information. It holds great promise for quantitative phase imaging (QPI) on a large population of cells in parallel. However, detector undersampling leads to spectrum aliasing, which may significantly degenerate the resolution, efficiency, and quality of QPI, especially when an objective lens with a high space-bandwidth product is used. Here, we introduce a diagonal illumination scheme for FPM to minimize spectrum aliasing, enabling high-resolution QPI under a limited detector sampling rate. By orienting the LED illumination diagonally relative to the detector plane, the non-aliased sampling frequency of the raw image under oblique illumination can be maximized. This illumination scheme, when integrated with a color camera, facilitates single-shot, high-throughput QPI, effectively overcoming spectrum aliasing and achieving incoherent diffraction-limited resolution. Theoretical analysis, simulations, and experiments on resolution target and live cells validate the effectiveness and the proposed illumination scheme, offering a potential guideline for designing an FPM platform for high-speed QPI under the limited detector sampling rates. (c) 2024 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.