A model for photon counting X-ray event reconstruction uncertainty

L.S. Jones,C. Crews,J. Ivory,A. Holland
DOI: https://doi.org/10.1088/1748-0221/19/05/p05017
2024-05-10
Journal of Instrumentation
Abstract:Evaluation of detectors for a soft X-ray imaging spectrometer has resulted in the need to understand the effect of charge spreading on apparent detector noise properties, and therefore achievable energy resolution. This paper presents a mathematical model for the processes leading to increased uncertainty within a simplified X-ray reconstruction process. This is a description for additional uncertainty introduced by the process of collecting X-ray generated electrons into a region of noisy pixels and reconstructing the recorded pixels values back into an estimated X-ray energy value. The predictions of the model, and preliminary experimental verification are shown.
instruments & instrumentation
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