SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

L. Meng,D. Nagalingam,C. S. Bhatia,A. G. Street,J. Phang
DOI: https://doi.org/10.1109/IRPS.2010.5488781
2010-05-02
Abstract:Morphological and electrical defects in solar cells are distinguished by combining Scanning Electron Acoustic Microscopy (SEAM) and Electron Beam Induced Current (EBIC) techniques. These techniques provide complementary information on grain boundaries and defects that affect solar cell performance in different ways.
What problem does this paper attempt to address?