Similarity Metric

J. Daugman,Andy Adler,Stephanie Schuckers,Karthik Nandakumar,L. Kennell,R. Rakvic,R. Broussard,D. Matrouf,J. Bonastre,R. Cappelli,M. Martinez-Diaz,Julian Fiérrez,S. Hangai,O. Henniger,D. Muramatsu
DOI: https://doi.org/10.1007/978-0-387-73003-5_381
Abstract:
What problem does this paper attempt to address?