Single-pixel positron beam diagnosis via compressive sampling

Jia-Yi Xu,Peng Kuang,Xing-Zhong Cao,Fu-Yan Liu,Hong-Qiang Zhang,Xiao-Tian Yu,Bao-Yi Wang,Hai-Ying Wang
DOI: https://doi.org/10.1063/5.0216684
2024-08-01
Abstract:The morphology is a crucial indicator for diagnosing a low-energy, low-brightness particle beam. However, conventional positron beam diagnosis, based on the pixel scanning principle, is limited by physical constraints, such as the resolution of detector pixels. Here, we have presented a novel slow positron diagnosis method using compressive sampling. With a 100 × 100 pixel-sized mask, for example, the positron beam morphology can be significantly reconstructed with a peak signal-to-noise ratio of ∼40 dB, even at half the sampling rate compared to pixel scanning. It explores a promising approach for positron beam diagnosis with an ultra-high resolution and fast sampling rates.
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