Lowering reporting limit values for respirable crystalline silica analysis by X-ray diffraction in preparation of the 0.025 mg/m3 occupational exposure limit

Akemi Ichikawa,Elisabeth Corke,Anne-Marie Moubarak,Martin Mazereeuw,John Volpato,Michael Weller,Dennis Clemence
DOI: https://doi.org/10.1093/annweh/wxae066
2024-09-27
Abstract:Internationally, respirable crystalline silica (RCS) occupational exposure limits (OELs) are being reassessed and, in some jurisdictions, lowered, putting pressure on the capabilities of the analytical techniques used to achieve robust analyses and reliable detection limits. In preparation of a lower OEL, options for lowering the limit of detection (LoD) for RCS analysis have been assessed. Using a Direct-on-Filter X-Ray Diffraction (XRD) analysis under reduced scan speeds in combination with low-noise RCS sampling filters, an LoD of 0.25 µg/filter and a limit of quantification (LoQ) of 0.82 µg/filter can be achieved. Both limits would translate in an LoD of 0.24 µg/m3 and LoQ of 0.78 µg/m3 when sampling respirable dust for 8 h at 2.2 L/min, providing a technical solution to monitor exposures at the proposed OEL of 0.025 mg/m3 (25 µg /m3) and below, with general sampling conditions as typically applied in Australia. This is the first report showing that the OEL of 0.025 mg/m3 (25 µg /m3) is measurable by one of the standardized, direct-on-filter XRD methods.
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