Electron beam ion sources and traps (invited)

R. Becker
DOI: https://doi.org/10.1063/1.1150302
2000-02-04
Abstract:The electron beam method of stepwise ionization to highest charge states has found applications in electron beam ion sources (EBISs) for accelerators and atomic physics collision experiments as well as in electron beam ion traps (EBITs) for x-ray and mass spectroscopy. A dense and almost monoenergetic electron beam provides a unique tool for ionization, because radiative recombination by slow electrons is negligible and charge exchange is almost avoided in ultrahigh vacua. These are essential differences to electron cyclotron resonance ion sources with inevitable low energy electrons and comparatively high gas pressure. The distinction between EBIS and EBIT as genuine devices has become meaningless, because EBISs may work as traps and almost all EBITs are feeding beamlines for external experiments. More interesting is to note the diversification of these devices, which demonstrates that a matured technology is finding dedicated answers for different applications. At present we may distinguish six major li...
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