Abstract:In this work, we introduce a quantum-based quantitative phase microscopy technique using a phase gradient approach that is inherently background resistant and does not rely on interferometry or scanning. Here, a transparent sample is illuminated by both photons of a position-momentum entangled pair with one photon setup for position measurement in the near-field (NF) of the sample and its partner for momentum measurement in the far-field (FF). By virtue of the spatial correlation property inherent to the entanglement, both the position and momentum information of the photons can thus be obtained simultaneously. The phase profile of the sample is then deduced through a phase gradient measurement obtained by measuring the centroid shift of the photons' in the FF momentum plane for each NF position. We show that the technique, while achieving an imaging resolution of 2.76\,$\mu$m, is phase accurate to at least $\lambda/30$ and phase sensitive to $\lambda/100$ at a wavelength of 810\,nm. In addition, through the temporal correlation between the photon pairs, our technique shows resilience to strong dynamic background lights, which can prove difficult to account for in classical phase imaging techniques. We believe this work marks a significant advancement in the capabilities of quantum phase microscopy and quantum imaging in general, it showcases imaging and phase resolutions approaching those attainable with classical phase microscopes. This advancement brings quantum imaging closer to practical real-world applications, heralding new possibilities in the field.

Enhanced Quantitative Wavefront Imaging for Nano-Object Characterization

High-Sensitivity Quantitative Phase Microcopy

High-sensitivity Quantitative Phase Microcopy (conference Presentation)

Surface wave illumination Fourier ptychographic microscopy.

Quantitative Phase Imaging Based on Wavefront Correction of a Digital Micromirror Device

Quantitative Phase and Amplitude Imaging with an Efficient Support Constraint.

High-speed Fourier Ptychographic Microscopy for Quantitative Phase Imaging.

Single-shot quantitative phase-fluorescence imaging using cross-grating wavefront microscopy

Transport of intensity phase microscopy combined with accelerated iteration for quantitative phase imaging

Quantum enhanced non-interferometric quantitative phase imaging

Non-interferometric Quantitative Phase Microscopy Based on Kramers-Kronig Relations for Large Phase Objects

Quantitative phase imaging by common-path interferometric microscopy: application to super-resolved imaging and nanophotonics

Efficient Quantitative Phase Microscopy Using Programmable Annular Led Illumination

Optical Digital Coherent Detection Technology Enabled Flexible and Ultra-Fast Quantitative Phase Imaging

Quantitative phase imaging via a multimode fiber

Quantitative Phase Imaging with a Metalens

Quantitative phase imaging based on Fresnel diffraction from a phase plate

Quantitative phase retrieval for Zernike phase-contrast microscopy

Background resilient quantitative phase microscopy using entangled photons

Quantitative Phase Retrieval in X-ray Zernike Phase Contrast Microscopy.

Centimeter-sized Objects at Micrometer Resolution: Extending Field-of-View in Wavefront Marker X-ray Phase-Contrast Tomography