Reliability investigation of light-emitting diodes via low frequency noise characteristics

S. Pralgauskaitė,V. Palenskis,J. Matukas,J. Glemza,G. Muliuk,B. Saulys,Augustinas Trinkunas
DOI: https://doi.org/10.1016/j.microrel.2014.09.027
Abstract:
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