Design and Temperature Reliability Testing for A 0.6–2.14GHz Broadband Power Amplifier

Q. Lin,Qian-Fu Cheng,Junjie Gu,Yuanyuan Zhu,Chao Chen,Haipeng Fu
DOI: https://doi.org/10.1007/s10836-016-5571-7
2016-04-01
Journal of Electronic Testing
Abstract:
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