Combining imaging ellipsometry and grazing incidence small angle X-ray scattering for in situ characterization of polymer nanostructures

V. Körstgens,J. Wiedersich,R. Meier,J. Perlich,S. Roth,R. Gehrke,P. Müller‐Buschbaum
DOI: https://doi.org/10.1007/s00216-009-3008-1
Analytical and Bioanalytical Chemistry
Abstract:
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