C-CREST Technique for Combinational Logic SET Testing

J. Ahlbin,J. Black,L. Massengill,O. Amusan,A. Balasubramanian,M. Casey,D. Black,M. Mccurdy,R. Reed,B. Bhuva

DOI: https://doi.org/10.1109/TNS.2008.2005900

IF: 1.703

2008-12-01

IEEE Transactions on Nuclear Science

Abstract:SEUs due to combinational logic in 90 nm CMOS is analyzed at various speeds using a new design approach called the combinational circuit for radiation effects self-test (C-CREST). C-CREST allows the cross-section of combinational logic to be increased while minimizing propagation delay. The design was fabricated in IBM's 9SF CMOS process and underwent broadbeam testing that distinguished combinational logic errors from latch errors. Results confirm that the design is effective in testing combinational logic for SE vulnerabilities with minimum speed penalty.