The effect of bending radius on V-I characteristics of mono- and multicored BiPb-2223 tapes with and without Ag additions

I. Akimov,E. V. Antipova,S.N. Barabanov,N. Kozlenkova,P. Kuznetsov,A. Nikulin,D. N. Rakov,A. Shikov,N. Khlebova,D.A. Filitchev
DOI: https://doi.org/10.1109/77.620769
IF: 1.9489
1997-06-01
IEEE Transactions on Applied Superconductivity
Abstract:The effect of bending strain on Voltage-Current Characteristics (VCC) of BiPbSrCaCuO-2223/(Ag and Ag-alloy sheathed) tapes with and without Ag additions into the core have been studied. The testing probe allows us to carry out all set of bending tests up to radius 5 mm on the same specimen. The critical current Ic and shape of high-sensitivity VCC as a function of bending strain are analysed. Degradation of current carrying capacity under bending deformation is caused by the formation of microcracks. The overlapping of microcracks in Bi-2223/Ag sheathed tapes without Ag additions leads to current overflow into the Ag sheath and to appearance of linear resistance segment in the V-I curve at low electric field.
What problem does this paper attempt to address?