Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling.

Radouane Fikri,T. Grosges,D. Barchiesi
DOI: https://doi.org/10.1364/OL.28.002147
IF: 3.6
2003-11-15
Optics Letters
Abstract:In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.
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