GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing

A. Bensoussan,R. Marec,Jean Luc Muraro,L. Portal,P. Calvel,Catherine Barillot,Marie Genevieve Perichaud,L. Marchand,G. Vignon
DOI: https://doi.org/10.1016/j.microrel.2013.07.019
2013-09-01
Abstract:
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