Built-in self-test for large embedded CMOS folded PLAs

R. Dandapani,R. K. Gulati,D. K. Goel
DOI: https://doi.org/10.1109/ICCAD.1988.122501
1988-11-07
Abstract:A built-in self-test (BIST) design method for large embedded CMOS folded programmable logic arrays (PLAs) is presented that is based on a deterministic, function-independent structural method. It requires about half the testing time and comparable area overhead of deterministic BIST methods applied to corresponding nonfolded PLAs. Tests to detect stuck-at, bridging, cross-point and stuck-open faults are given.<<ETX>>
What problem does this paper attempt to address?