Advanced Diffraction and Scattering Beamline Scoping Group Report

D. J. Daniels,M. Rowles
Abstract:By simultaneous acquisition of the transmitted and the diffracted beams, the applicability of the previously introduced diffraction contrast tomography technique [Ludwig, Schmidt, Lauridsen & Poulsen (2008). J. Appl. Cryst. 41, 302–309] can be extended to the case of undeformed polycrystalline samples containing more than 100 grains per cross section. The grains are still imaged using the occasionally occurring diffraction contribution to the X-ray attenuation coefficient, which can be observed as a reduction in the intensity of the transmitted beam when a grain fulfils the diffraction condition. Automating the segmentation of the extinction spot images is possible with the additional diffracted beam information, even in the presence of significant spot overlap. By pairing the corresponding direct (‘extinction’) and diffracted beam spots a robust sorting and indexing approach has been implemented. The analysis procedure is illustrated on a real data set and the result is validated by comparison with a two-dimensional grain map obtained by electron backscatter diffraction. Johnson, G., King, A., Honnicke, M. G., Marrow, J. & Ludwig, W. 2008, 'X-Ray Diffraction Contrast Tomography: A Novel Technique for Three-Dimensional Grain Mapping of Polycrystals. II. The Combined Case', Journal of Applied Crystallography, vol. 41, pp. 310-318. References 1. Honkimaki, V., Personal Communication, J. Daniels, Editor. 2011. 2. Honkimaki, V. UPBL2: High energy beamline for buried interface structures and materials processing. 2010; Available from: http://www.esrf.eu/UsersAndScience/Experiments/StructMaterials/beamlineportfolio/CDR_UPBL02.pdf. 3. Peele, A., ISAP statistics. 2011. 4. Drakopolous, M., Personal Communication, J. Daniels, Editor. 2011. 5. Liss, K.-D., et al., High energy X-rays: A tool for advanced bulk investigations in materials science and physics. Textures and Microstructures, 2003. 35 p. 219-252. 6. Pyzalla, A., W. Reimers, and K.-D. Liss, A comparison of neutron and high-energy synchrotron radiation as tools for texture and stress analysis. Materials Science Forum, 2000. 347: p. 34-39 7. Scarlett, N.V.Y., et al., Energy Dispersive Diffraction Studies of Inert Anodes. Journal of Applied Crystallography, 2009. 42: p. 502-512. 8. Poulsen, H.F., D.J. Jensen, and G.B.M. Vaughan, Three-dimensional X-ray diffraction microscopy using high-energy X-rays. MRS Bulletin, 2004. 29(3): p. 166-9. 9. Vaughan, G.B.M., et al., X-ray transfocators: focusing devices based on compound refractive lenses. Journal of Synchrotron Radiation, 2011. 18: p. 125-133. 10. Zhong, Z., et al., Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. II. Experimental studies. Journal of Applied Crystallography, 2001. 34: p. 646-653. 11. Zhong, Z., et al., Sagittal focusing of high-energy synchrotron X-rays with asymmetric Laue crystals. I. Theoretical considertions. Journal of Applied Crystallography, 2001. 34: p. 504-509. 12. Pixium flat panel detector. 2011; Available from: http://www.thalesgroup.com/Portfolio/Security/Digital_detector__Pixium_RAD_4600_Portable_ 3543___3543C/?pid=1568. 13. Daniels, J.E. and M. Drakopolous, High-energy x-ray diffraction using the Pixium 4700 flat panel detector. Journal of Synchrotron Radiation, 2009. 16(4).
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