Oversampling Delta-Sigma ADC for Metrology Applications

D. Georgakopoulos,J. Pickering,J.M. Williams,P. Wright
DOI: https://doi.org/10.1109/CPEM.2004.305466
2004-06-01
Abstract:This paper focuses on the performance of the Delta-Sigma ADC for metrology applications and presents a quantum based Delta-Sigma ADC under development by Metron Designs and the National Physical Laboratory which is suitable for DC and low frequency spectrum analysis, voltage and power measurements
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