Modeling and Testing Comparison Faults of TCAMs with Asymmetric Cells

Yong-Jyun Hu,Yu-Jen Huang,Jin-Fu Li
DOI: https://doi.org/10.1109/VTS.2009.18
2009-05-03
Abstract:Ternary content addressable memory (TCAM) is a key component in various applications for its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects. Some new comparison faults which do not exist in a TCAM with symmetric cells are found. A march-like test algorithm is also proposed to cover the defined comparison faults. The test algorithm consists of 8N Write operations and (3N + 2B) Compare operations for an N×B-bit TCAM with Hit output only.
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