Abstract:Large‐area, high‐quality CsPbIBr2 thick films with (100)‐preferred orientation and low trap density are prepared using a spray‐coating method with air as a gas carrier via a dual‐additive‐assisted solution strategy. The unencapsulated X‐ray detector prepared based on CsPbIBr2 thick film exhibits high sensitivity (1420 μC Gyair−1 cm−2) and long‐term stability (80% of the original sensitivity after 1000 h). The realization of large‐area high‐quality perovskite thick films under an atmospheric environment without humidity control is confronting an urgent challenge for the applications in X‐ray detection and imaging. A spray‐coating method with air as the gas carrier is employed to achieve large‐area perovskite thick films for X‐ray flat‐panel detection applications. To further improve the quality of the thick films, the 10 μm‐thick CsPbIBr2 films with (100)‐preferred orientation, low trap density (7.1 × 1012 cm−3) and high resistivity corresponding to low dark current (3.2 × 10−9 A) are prepared via dual‐additive‐assisted (NH4SCN and L‐α‐phosphatidylcholine (LP)) solution strategy under atmospheric environment with relative humidity of 60% (60% RH). Thus, the metal‐semiconductor‐metal‐structured (Au/CsPbIBr2/Au) transverse X‐ray detection device under 40 KeV X‐ray irradiation possesses a high sensitivity up to 1420 μC Gyair−1 cm−2 under a weak electric field of 18 V mm−1 and a low dose rate of 3.3 μGyair s−1 that is lower than a dose rate of ≈5.5 μGyair s−1 required for routine medical diagnosis. Strikingly, the unencapsulated device maintains 80% (1120 μC Gyair−1 cm−2) of the original sensitivity after 1000 h under the atmospheric environment with 45–55% RH. These results pave the way for the practical applications of perovskite thick films in X‐ray medical detection and imaging.

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