Thin film analysis by X-ray scattering. By Mario Birkholz, with contributions by P. F. Fewster and C. Genzel. Pp. xxii+356. Weinheim: Wiley-VCH Verlag GmbH Co., 2005. Price (hardcover) EUR 119, SFR 188. ISBN-10: 3-527-31052-5; ISBN-13: 978-3-527-31052-4.

D. Chateigner
DOI: https://doi.org/10.1107/S0021889806034698
2006-12-01
Abstract:
What problem does this paper attempt to address?