The Relative Efficiency of Soft-Error Induction in 4K Static RAMS by Muons and Pions

J. Dicello,C. McCabe,J. Doss,M. Paciotti
DOI: https://doi.org/10.1109/TNS.1983.4333182
IF: 1.703
1983-12-01
IEEE Transactions on Nuclear Science
Abstract:Soft-error rates in a 4K static RAM have been obtained for 164 MeV/c pions and 109 MeV/c muons. The pion beams were found to be at least 10000 times more effective than were the muon beams, with the implication that effects of pions in cosmic rays at sea level may not be negligible.
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