Black silicon based iris with reduced light scattering and reflection

Yousuf D. Almoallem,M. Moghimi,Hongrui Jiang
DOI: https://doi.org/10.1109/OMN.2017.8051469
2017-08-01
Abstract:This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.
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