An integrated method for phenotypic analysis of wheat based on multi-view image sequences: from seedling to grain filling stages
Shengxuan Sun,Yeping Zhu,Shengping Liu,Yongkuai Chen,Yihan Zhang,Shijuan Li
DOI: https://doi.org/10.3389/fpls.2024.1459968
2024-08-19
Abstract:Wheat exhibits complex characteristics during its growth, such as extensive tillering, slender and soft leaves, and severe organ cross-obscuration, posing a considerable challenge in full-cycle phenotypic monitoring. To address this, this study presents a synthesized method based on SFM-MVS (Structure-from-Motion, Multi-View Stereo) processing for handling and segmenting wheat point clouds, covering the entire growth cycle from seedling to grain filling stages. First, a multi-view image acquisition platform was constructed to capture image sequences of wheat plants, and dense point clouds were generated using SFM-MVS technology. High-quality dense point clouds were produced by implementing improved Euclidean clustering combined with centroids, color filtering, and statistical filtering methods. Subsequently, the segmentation of wheat plant stems and leaves was performed using the region growth segmentation algorithm. Although segmentation performance was suboptimal during the tillering, jointing, and booting stages due to the glut leaves and severe overlap, there was a salient improvement in wheat leaf segmentation efficiency over the entire growth cycle. Finally, phenotypic parameters were analyzed across different growth stages, comparing automated measurements of plant height, leaf length, and leaf width with actual measurements. The results demonstrated coefficients of determination ( R 2 ) of 0.9979, 0.9977, and 0.995; root mean square errors (RMSE) of 1.0773 cm, 0.2612 cm, and 0.0335 cm; and relative root mean square errors (RRMSE) of 2.1858%, 1.7483%, and 2.8462%, respectively. These results validate the reliability and accuracy of our proposed workflow in processing wheat point clouds and automatically extracting plant height, leaf length, and leaf width, indicating that our 3D reconstructed wheat model achieves high precision and can quickly, accurately, and non-destructively extract phenotypic parameters. Additionally, plant height, convex hull volume, plant surface area, and Crown area were extracted, providing a detailed analysis of dynamic changes in wheat throughout its growth cycle. ANOVA was conducted across different cultivars, accurately revealing significant differences at various growth stages. This study proposes a convenient, rapid, and quantitative analysis method, offering crucial technical support for wheat plant phenotypic analysis and growth dynamics monitoring, applicable for precise full-cycle phenotypic monitoring of wheat.