Enhanced multi-level features for very high resolution remote sensing scene classification

Chiranjibi Sitaula,Sumesh KC,Jagannath Aryal
DOI: https://doi.org/10.1007/s00521-024-09446-y
2024-02-21
Neural Computing and Applications
Abstract:Very high resolution (VHR) remote sensing (RS) scene classification is a challenging task due to the higher inter-class similarity and intra-class variability problems. Recently, the existing deep learning (DL)-based methods have shown great promise in VHR RS scene classification. However, they still provide an unstable classification performance. To address such a problem, we herein propose a DL-based novel approach using an enhanced VHR attention module (EAM), which captures the richer salient multi-scale information for a more accurate representation of the VHR RS image during classification. Experimental results on three widely used VHR RS data sets show that the proposed approach yields a competitive and stable/consistent classification performance with the least standard deviation of 0.001. Further, the highest overall accuracies on the AID, NWPU, and UCM data sets are 95.39%, 93.04%, and 98.61%, respectively. Such encouraging, consistent and improved results shown through detailed ablation and comparative study provide a solution to the remote sensing community for the land use and land cover (LULC) classification problems with more trust and confidence. The source code of this work is available at https://github.com/csitaula/EAM.
computer science, artificial intelligence
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