Electro-optic field mapping system utilizing external gallium arsenide probes

Kyoung Yang,L. Katehi,J. Whitaker
DOI: https://doi.org/10.1063/1.127019
2000-07-17
Abstract:External electro-optic probes fabricated from two different crystal orientations of GaAs have been implemented in an electro-optic sampling system that is capable of mapping three independent orthogonal components of free-space electric fields. The results obtained for the radiated field from a microstrip patch antenna by the GaAs probes are compared with results on the same antenna obtained using bismuth silicate and lithium tantalate probes. An 8 μm spatial resolution has also been demonstrated for the electro-optic field-mapping system, and the capability for the system to measure field patterns at frequencies up to 100 GHz has been shown.
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