Fault Detection of Bloom Filters for Defect Maps

Jae-Young Choi,Yoon-Hwa Choi
DOI: https://doi.org/10.1109/DFT.2008.41
2008-10-01
Abstract:Bloom filters can be used as a data structure for defect maps in nanoscale memory. Unlike most other applications of Bloom filters, both false positive and false negative induced by a fault cause a fatal error in the memory system. In this paper, we present a technique for detecting faults in Bloom filters for defect maps. Spare hashing units and a simple coding technique for bit vectors are employed to detect faults during normal operation. Parallel write/read is also proposed to detect faults with high probability even without spare hashing units.
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