Emergence symmetry protected topological phase in spatially tuned measurement-only circuit

Yoshihito Kuno,Ikuo Ichinose
DOI: https://doi.org/10.48550/arXiv.2212.13142
2022-12-26
Statistical Mechanics
Abstract:Topological phase transition induced by spatially-tuned single-site measurement is investigated in a measurement-only circuit, in which three different types of projective measurement operator. Specific spatial setting and combination of commutation relations among three measurement operators generate such a transition. In practice, symmetry protected topological (SPT) phase is recovered on even sublattice by eliminating a projective measurement disturbing the SPT via applying another spatially-tuned projective measurement on odd sublattice. We further investigate the critical properties of the phase transition and find that it has the same critical exponents with the two-dimensional percolation transition.
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