Anisotropy constant of antiferromagnetic Pt 50 Mn 50

William Frost,Robert Carpenter,Gonzalo Vallejo-Fernandez
DOI: https://doi.org/10.1088/1361-6463/ad2564
2024-02-03
Journal of Physics D Applied Physics
Abstract:We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as (2.5 ± 0.5) · 10 7 erg/cm 3 were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400 ◦ C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200 ◦ C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials.
physics, applied
What problem does this paper attempt to address?