Enhanced light absorption in monolayer tungsten disulfide with dielectric Bragg reflector and metallic thin film

Guo-Ping Luo,Xing-Yuan Chen,Su-Mei Hu,Wei-Ling Zhu
DOI: https://doi.org/10.1016/j.ijleo.2021.166781
IF: 3.1
2021-08-01
Optik
Abstract:<p>A multi-layer structure based on the microcavity effect of a dielectric Bragg reflector (DBR) and metallic thin film to enhance light absorption of monolayer tungsten disulfide (WS<sub>2</sub>) is proposed. This structure is combined with a cover layer and a spacer layer to adjust the phase-matching condition. The transfer matrix method (TMM) was used to study its optical transport characteristics. It was found that the microcavity effect of DBR and the metallic thin film forms a maximum value of electric field intensity near the monolayer WS<sub>2</sub>, which effectively promotes the light-matter interaction in monolayer WS<sub>2</sub>. As the thicknesses of the spacer layer and cover layer were comprehensively optimized, the light absorption of monolayer WS<sub>2</sub> at the wavelength of 611 nm reached 94.38 % and the full width at half maximum (FWHM) is only 9 nm. Furthermore, the effect of DBR periodicity and angle of incidence on the light absorption of monolayer WS<sub>2</sub> were discussed. The research presented here confirms that changing the above structural parameters can effectively regulate the absorption peak wavelength and maximum value of monolayer WS<sub>2</sub>. The results of this study provide new ideas for the preparation of high-performance monolayer WS<sub>2</sub> photodetectors and other new optoelectronic devices.</p>
optics
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