Study on the bias-dependent effects of proton-induced damage in CdZnTe radiation detectors using ion beam induced charge microscopy.

Yaxu Gu,W. Jie,Caicai Rong,Lingyan Xu,Yadong Xu,H. Lv,H. Shen,G. Du,Na Guo,Rongrong Guo,G. Zha,Tao Wang,Shouzhi Xi
DOI: https://doi.org/10.1016/j.micron.2016.06.003
IF: 2.381
2016-09-01
Micron
Abstract:
What problem does this paper attempt to address?