Quantitative measurement of figure of merit for transverse thermoelectric conversion in metallic multilayers

Takumi Yamazaki,Takamasa Hirai,Takashi Yagi,Yuichiro Yamashita,Ken-ichi Uchida,Takeshi Seki,Koki Takanashi
DOI: https://doi.org/10.1103/physrevapplied.21.024039
IF: 4.6
2024-02-22
Physical Review Applied
Abstract:This study presents a measurement method for determining the figure of merit for transverse thermoelectric conversion ( zTT ) in thin-film forms. Leveraging the proposed methodology, we comprehensively investigate the transverse thermoelectric coefficient ( ), in-plane electrical conductivity ( σyy ), and out-of-plane thermal conductivity ( κxx ) in epitaxial and polycrystalline Fe/Pt metallic multilayers. Multilayers with a number of stacking repetitions ( N ) of 200 have κxx values that are lower than those of FePt alloy films, indicating that the multilayer structure effectively contributes to the suppression of κxx . zTT is found to increase with increasing N , which remarkably reflects the N -dependent enhancement of the ST values. Notably, ST and σyy are significantly larger in the epitaxial multilayers than in the polycrystalline counterparts, whereas negligible differences in κxx are observed between the epitaxial and polycrystalline multilayers. The present measurement technique reveals the transverse thermoelectric properties inherent to multilayers. https://doi.org/10.1103/PhysRevApplied.21.024039 © 2024 American Physical Society
physics, applied
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