Measuring the effective channel length of MOSFETs

K. Ng,J. Brews
DOI: https://doi.org/10.1109/101.100256
1990-11-01
IEEE Circuits and Devices Magazine
Abstract:Eleven measurement methods are outlined, and their assumptions are examined. The methods are analyzed, critiqued, and compared. Recommendations are made as to which methods are best under various conditions.<<ETX>>
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