Optical properties and electrical transport of thin films of terbium(III) bis(phthalocyanine) on cobalt

Peter Robaschik,Pablo F Siles,Daniel Bülz,Peter Richter,Manuel Monecke,Michael Fronk,Svetlana Klyatskaya,Daniel Grimm,Oliver G Schmidt,Mario Ruben,Dietrich R T Zahn,Georgeta Salvan
DOI: https://doi.org/10.3762/bjnano.5.215
2014-11-11
Abstract:The optical and electrical properties of terbium(III) bis(phthalocyanine) (TbPc2) films on cobalt substrates were studied using variable angle spectroscopic ellipsometry (VASE) and current sensing atomic force microscopy (cs-AFM). Thin films of TbPc2 with a thickness between 18 nm and 87 nm were prepared by organic molecular beam deposition onto a cobalt layer grown by electron beam evaporation. The molecular orientation of the molecules on the metallic film was estimated from the analysis of the spectroscopic ellipsometry data. A detailed analysis of the AFM topography shows that the TbPc2 films consist of islands which increase in size with the thickness of the organic film. Furthermore, the cs-AFM technique allows local variations of the organic film topography to be correlated with electrical transport properties. Local current mapping as well as local I-V spectroscopy shows that despite the granular structure of the films, the electrical transport is uniform through the organic films on the microscale. The AFM-based electrical measurements allow the local charge carrier mobility of the TbPc2 thin films to be quantified with nanoscale resolution.
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