Abstract:The capability of machine learning methods for identifying and separating artifacts that appear in a typical X‐ray diffraction image is demonstrated.In situ synchrotron high‐energy X‐ray powder diffraction (XRD) is highly utilized by researchers to analyze the crystallographic structures of materials in functional devices (e.g. battery materials) or in complex sample environments (e.g. diamond anvil cells or syntheses reactors). An atomic structure of a material can be identified by its diffraction pattern along with a detailed analysis of the Rietveld refinement which yields rich information on the structure and the material, such as crystallite size, microstrain and defects. For in situ experiments, a series of XRD images is usually collected on the same sample under different conditions (e.g. adiabatic conditions) yielding different states of matter, or is simply collected continuously as a function of time to track the change of a sample during a chemical or physical process. In situ experiments are usually performed with area detectors and collect images composed of diffraction patterns. For an ideal powder, the diffraction pattern should be a series of concentric Debye–Scherrer rings with evenly distributed intensities in each ring. For a realistic sample, one may observe different characteristics other than the typical ring pattern, such as textures or preferred orientations and single‐crystal diffraction spots. Textures or preferred orientations usually have several parts of a ring that are more intense than the rest, whereas single‐crystal diffraction spots are localized intense spots owing to diffraction of large crystals, typically >10 μm. In this work, an investigation of machine learning methods is presented for fast and reliable identification and separation of the single‐crystal diffraction spots in XRD images. The exclusion of artifacts during an XRD image integration process allows a precise analysis of the powder diffraction rings of interest. When it is trained with small subsets of highly diverse datasets, the gradient boosting method can consistently produce high‐accuracy results. The method dramatically decreases the amount of time spent identifying and separating single‐crystal diffraction spots in comparison with the conventional method.

Crystal Structure Determination from Powder Diffraction Patterns with Generative Machine Learning

Powder Diffraction Crystal Structure Determination Using Generative Models

Ab Initio Structure Solutions from Nanocrystalline Powder Diffraction Data

Towards end-to-end structure determination from x-ray diffraction data using deep learning

Towards End-to-End Structure Solutions from Information-Compromised Diffraction Data via Generative Deep Learning

Identifying Crystal Structures Beyond Known Prototypes from X-ray Powder Diffraction Spectra

Symmetry prediction and knowledge discovery from X-ray diffraction patterns using an interpretable machine learning approach

DiffractGPT: Atomic Structure Determination from X-ray Diffraction Patterns using Generative Pre-trained Transformer

Artifact Identification in X-ray Diffraction Data using Machine Learning Methods

End-to-End Crystal Structure Prediction from Powder X-Ray Diffraction

A Powder Diffraction-AI Solution for Crystalline Structure

Crystal Structure Assignment for Unknown Compounds from X-ray Diffraction Patterns with Deep Learning.

Crystal Structure Assignment for Unknown Compounds from X-ray Diffraction Patterns with Deep Learning

Exploring Supervised Machine Learning for Multi-Phase Identification and Quantification from Powder X-Ray Diffraction Spectra

Simultaneous Determination of Several Crystal Structures from Powder Mixtures: the Combination of Powder X-ray Diffraction, Band-Target Entropy Minimization and Rietveld Methods

Artifact identification in X‐ray diffraction data using machine learning methods

MLstructureMining: a machine learning tool for structure identification from X-ray pair distribution functions

Powder x-ray diffraction analysis with machine learning for organic-semiconductor crystal-structure determination

Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification

Powder X-Ray Diffraction Assisted Evolutionary Algorithm for Crystal Structure Prediction