Synthetic gain for electron-beam spectroscopy

Yongliang Chen,Kebo Zeng,Zetao Xie,Yixin Sha,Zeling Chen,Xudong Zhang,Shu Yang,Shimeng Gong,Yiqin Chen,Huigao Duan,Shuang Zhang,Yi Yang

2024-10-22

Abstract:Electron-beam microscopy and spectroscopy featuring atomic-scale spatial resolution have become essential tools used daily in almost all branches of nanoscale science and technology. As a natural supercontinuum source of light, free electrons couple with phonons, plasmons, electron-hole pairs, inter- and intra-band transitions, and inner-shell ionization. The multiple excitations, intertwined with the intricate nature of nanostructured samples, present significant challenges in isolating specific spectral characteristics amidst complex experimental backgrounds. Here we introduce the approach of synthetic complex frequency waves to mitigate these challenges in free-electron--light interaction. The complex frequency waves, created through causality-informed coherent superposition of real-frequency waves induced by free electrons, offer virtual gain to offset material losses. This amplifies and enhances spectral features, as confirmed by our electron energy loss and cathodoluminescence measurements on multi-layer membranes, suspended nanoparticles, and film-coupled nanostructures. Strikingly, we reveal that our approach can retrieve resonance excitation completed buried underneath the zero-loss peak, substantially enhance the quality of hyperspectral imaging, and resolve entangled multiple-photon--electron events in their quantum interaction. Our findings indicate the versatile utility of complex frequency waves in various electron-beam spectroscopy and their promising diagnostic capabilities in free-electron quantum optics.

Optics,Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

The problems that this paper attempts to solve are: in electron - beam microscopy and spectroscopy, due to the naturally weak interaction between free electrons and photons, problems such as low signal - to - noise ratio, difficult - to - distinguish or lost spectral features are encountered during the measurement process. Specifically:

1. **Low Signal - to - Noise Ratio (SNR) Problem**: Especially when using Electron Energy - Loss Spectroscopy (EELS) at high energy resolution, the signal - to - noise ratio is very low.
2. **Spectral Features Masked**: Since free - electron excitation naturally contains all frequency components, adjacent spectral features may be partially masked by the tails of their neighbors, especially the zero - loss peak masks low - energy excitation.
3. **Difficulty in Detecting Multi - Photon Events**: In free - electron quantum optics, spontaneous multi - photon events follow a Poisson distribution and have a low probability, and methods are required to confirm their experimental characteristics.

To solve these problems, the author introduced a method based on Complex Frequency Wave (CFW). Through coherently superposing guided by causality to create a complex - frequency wave with virtual gain, thereby compensating for material losses and enhancing spectral features. This method can significantly improve spectral resolution, and can recover the resonant excitation masked by the zero - loss peak, improve hyperspectral imaging quality, and analyze entangled multi - photon - electron events.

Through theoretical analysis and experimental verification, the author demonstrated the application effects of the CFW method on various samples, including multilayer films, suspended nanoparticles, and thin - film - coupled nanostructures, proving its broad application potential in electron - beam microscopy and spectroscopy.

### Key Formulas
The key formulas involved in the paper include:
- Complex - Frequency - Wave Expression:
\[
E_T = E_0 e^{-i \tilde{\omega} t} \Theta(t)
\]
where \(\tilde{\omega}=\omega - i\frac{\gamma}{2}\), \(E_0\) is the original signal, \(E_T\) is the time - truncated signal, and \(\Theta(t)\) is the Heaviside step function.
- Probability Expression of Virtual Gain:
\[
\tilde{\Gamma}(\tilde{\omega})\approx\sum_n\tilde{\Gamma}(\omega_n) e^{-i\omega_n t + i\tilde{\omega} t}\Delta\omega/(2\pi i(\tilde{\omega}-\omega_n))
\]

These formulas are used to describe how to enhance spectral features and compensate for material losses through complex - frequency - wave processing.