Chunyan Li,Haiwen Liu,X. C. Xie
Abstract:Logarithmic aging phenomena are prevalent in various systems, including electronic materials and biological structures. This study utilizes a generalized continuous time random walk (CTRW) framework to investigate the mechanisms behind the logarithmic aging phenomena. By incorporating non-Markovian jump processes with significant memory effects, we modify traditional diffusion models to exhibit logarithmic decay in both survival and return probabilities. In addition, we analyze the impact of aging on autocorrelation functions, illustrating how long-term memory behaviors affect the temporal evolution of physical properties. These results connect microscopic models to macroscopic manifestations in real-world systems, advancing the understanding of ultraslow dynamics in disordered systems.
Statistical Mechanics,Disordered Systems and Neural Networks,Soft Condensed Matter
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to understand the mechanisms behind ultraslow aging phenomena. Specifically, the researchers use the Generalized Continuous - Time Random Walk (CTRW) framework to explore the causes of logarithmic aging phenomena. By modeling the significant memory effects in non - Markovian jump processes, they modify the traditional diffusion model to exhibit logarithmic decay in survival probability and return probability. In addition, the study also analyzes the influence of aging on the autocorrelation function, showing how long - term memory behavior affects the time evolution of physical properties. These results help to link microscopic models with macroscopic manifestations in real - world systems, thereby deepening the understanding of ultraslow dynamics in disordered systems.
### Main research contents:
1. **Model construction**: Use the generalized CTRW framework, combined with non - renewable processes, to simulate the memory effects in non - Markovian jump processes.
2. **Logarithmic aging diffusion**: By introducing a specific form of waiting time distribution, such as \(\psi_1(t, t_a)=\frac{\sin(\pi\alpha)}{\pi}\frac{t_a^\alpha}{t^\alpha(t + t_a)}\), the researchers show ultraslow dynamics \(\langle n\rangle\sim\frac{1}{u(\alpha)}\ln(\frac{t}{t_0})\), where \(u(\alpha)=-\gamma-\frac{\partial\ln\Gamma(\alpha)}{\partial\alpha}\).
3. **Survival probability and return probability**: Derive the survival probability and return probability of the target particle in the logarithmic aging diffusion process, and show their logarithmic decay characteristics over time.
4. **Autocorrelation function**: Study the ultraslow decay behavior of the position autocorrelation function \(C_x = \langle x(t)x(0)\rangle\), and reveal its relationship with logarithmic aging diffusion.
5. **Environmental impact**: Explore the influence of different parameters (such as initial time \(t_0\), system size \(L\), and the exponent \(\alpha\) of the waiting time distribution) on the survival probability and return probability.
### Key formulas:
- **Dynamics of logarithmic aging diffusion**:
\[
\langle n\rangle\sim\frac{1}{u(\alpha)}\ln\left(\frac{t}{t_0}\right)
\]
- **Survival probability**:
\[
\phi(t)\sim1-\frac{1}{L}\sqrt{\frac{8\ln(t/t_0)}{\pi u(\alpha)}}
\]
- **Return probability**:
\[
P(x = 0,t)\sim\frac{1}{\sqrt{2\pi u^{-1}(\alpha)\ln(t/t_0)}}
\]
- **Position autocorrelation function**:
\[
C_x(t,t_0)\sim\left(\frac{t_0}{t}\right)^{a^2/(\sigma^2u(\alpha))}
\]
### Conclusion:
Through these studies, the authors not only reveal the microscopic mechanisms of the logarithmic aging phenomenon, but also provide a unified framework to describe normal diffusion, sub - diffusion, and logarithmic aging diffusion processes. These findings are of great significance for predicting the long - term behavior of complex systems and improving the design of materials and devices.