Paul Weinbrenner,Patricia Klar,Christian Giese,Luis Flacke,Manuel Müller,Matthias Althammer,Stephan Geprägs,Rudolf Gross,Friedemann Reinhard
Abstract:Planar scanning probe microscopy is a recently emerging alternative approach to tip-based scanning probe imaging. It can scan an extended planar sensor, such as a polished bulk diamond doped with magnetic-field-sensitive nitrogen-vacancy (NV) centers, in nanometer-scale proximity of a planar sample. So far, this technique has been limited to optical near-field microscopy, and has required nanofabrication of the sample of interest. Here we extend this technique to magnetometry using NV centers, and present a modification that removes the need for sample-side nanofabrication. We harness this new ability to perform a hitherto infeasible measurement - direct imaging of the three-dimensional vector magnetic field of magnetic vortices in a thin film magnetic heterostructure, based on repeated scanning with NV centers with different orientations within the same scanning probe. Our result opens the door to quantum sensing using multiple qubits within the same scanning probe, a prerequisite for the use of entanglement-enhanced and massively parallel schemes.
What problem does this paper attempt to address?
The problem that this paper attempts to solve is to achieve vector magnetic field imaging at the nanoscale. Specifically, the authors developed a planar scanning probe microscopy technique, using nitrogen - vacancy (NV) centers to directly image three - dimensional vector magnetic fields without the need for nanofabrication on the sample side.
### Problem Background
Although traditional tip - based scanning probe microscopes (such as AFM) can achieve high - resolution magnetic field imaging, they have several limitations:
1. **Complex Nanofabrication**: Complex nanofabrication on the diamond tip is required, and this fabrication will reduce the spin performance of the NV centers.
2. **Uniaxial Measurement**: Only the magnetic field component in one direction can be measured, and complete vector magnetic field information cannot be directly obtained.
3. **Limited Application Range**: It is usually limited to optical near - field imaging and is difficult to be applied to arbitrary samples.
### Core Contributions of the Paper
To solve the above problems, this paper proposes a new planar scanning probe microscopy technique, whose main features include:
- **No Need for Nanofabrication on the Sample Side**: By using an extended planar sensor (such as a polished diamond substrate), the need for nanofabrication on the sample is avoided.
- **Multi - directional NV Center Measurement**: Multiple NV centers with different orientations are included in one planar probe, so that the magnetic field components in three directions can be directly measured to achieve vector magnetic field imaging.
- **High Resolution and Sensitivity**: Magnetic field imaging can be carried out at the nanoscale, and it has high sensitivity and spatial resolution.
### Specific Implementation Methods
1. **Planar Probe Design**:
- A diamond substrate with a diameter of 50 µm and a height of 2.2 µm is used as a probe, and NV centers are shallowly implanted on the surface.
- The distance between the probe and the sample is precisely controlled by techniques such as interferometry and Brewster angle microscopy.
2. **Vector Magnetic Field Imaging**:
- Multiple scans are carried out using NV centers with different orientations to measure the resonance frequency of each NV center.
- Through non - linear least - squares fitting, the complete three - dimensional vector magnetic field is reconstructed from the measurement data.
### Experimental Verification
The authors verified the effectiveness of this technique through experiments and successfully carried out vector magnetic field imaging on a multi - layer magnetic structure containing magnetic vortices. The results show that this technique can resolve magnetic vortex structures of about 200 nm in size, and are consistent with the results of other imaging techniques (such as magnetic force microscopy).
### Conclusion
This paper demonstrates the potential of planar scanning probe microscopy to achieve vector magnetic field imaging at the nanoscale, and solves several bottleneck problems in traditional methods. This technique not only simplifies the experimental device, but also improves the imaging quality and application range, providing new possibilities for future quantum sensing and high - resolution magnetic field imaging.
### Key Formulas
The main formulas involved in the paper are as follows:
- Hamiltonian of NV centers:
\[
H = hD S_z^2 + h\gamma |B| \cos\theta S_z + h\gamma |B| \sin\theta S_x
\]
where \( D = 2.87 \, \text{GHz} \) is the zero - field splitting, \( S_z \) and \( S_x \) are Pauli matrices, \( h \) is Planck's constant, and \( \gamma = 28 \, \text{MHz/mT} \) is the gyromagnetic ratio of NV centers.
- Magnetic field vector projection:
\[
\frac{1}{\sqrt{3}} \begin{pmatrix} 1 \\ 1 \\ -1 \end{pmatrix} \cdot \begin{pmatrix} B_x \\ B_y \\ B_z \end{pmatrix} = |B| \cos\theta [1,1,1]
\]
These formulas are used to describe the energy level splitting of NV centers and the projection of magnetic field vectors, and are the basis for achieving vector magnetic field imaging.