Rethinking Multiple Instance Learning: Developing an Instance-Level Classifier via Weakly-Supervised Self-Training

Yingfan Ma,Xiaoyuan Luo,Mingzhi Yuan,Xinrong Chen,Manning Wang
2024-08-09
Abstract:Multiple instance learning (MIL) problem is currently solved from either bag-classification or instance-classification perspective, both of which ignore important information contained in some instances and result in limited performance. For example, existing methods often face difficulty in learning hard positive instances. In this paper, we formulate MIL as a semi-supervised instance classification problem, so that all the labeled and unlabeled instances can be fully utilized to train a better classifier. The difficulty in this formulation is that all the labeled instances are negative in MIL, and traditional self-training techniques used in semi-supervised learning tend to degenerate in generating pseudo labels for the unlabeled instances in this scenario. To resolve this problem, we propose a weakly-supervised self-training method, in which we utilize the positive bag labels to construct a global constraint and a local constraint on the pseudo labels to prevent them from degenerating and force the classifier to learn hard positive instances. It is worth noting that easy positive instances are instances are far from the decision boundary in the classification process, while hard positive instances are those close to the decision boundary. Through iterative optimization, the pseudo labels can gradually approach the true labels. Extensive experiments on two MNIST synthetic datasets, five traditional MIL benchmark datasets and two histopathology whole slide image datasets show that our method achieved new SOTA performance on all of them. The code will be publicly available.
Computer Vision and Pattern Recognition
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