Influence of surface relaxations on scanning probe microscopy images of the charge density wave material 2H-NbSe$_2$

Nikhil S. Sivakumar,Joost Aretz,Sebastian Scherb,Marion van Midden Mavrič,Nora Huijgen,Umut Kamber,Daniel Wegner,Alexander A. Khajetoorians,Malte Rösner,Nadine Hauptmann

2025-01-08

Abstract:Scanning tunneling microscopy is the method of choice for characterizing charge density waves by imaging the variation in atomic-scale contrast of the surface. Due to the measurement principle of scanning tunneling microscopy, the electronic and lattice degrees of freedom are convoluted, making it difficult to disentangle a structural displacement from spatial variations in the electronic structure. In this work, we characterize the influence of the displacement of the surface-terminating Se atoms on the 3 x 3 charge density wave contrast in scanning probe microscopy images of 2H-NbSe$_2$. In scanning tunneling microscopy images, we observe the 3 x 3 charge density wave superstructure and atomic lattice at all probed tip-sample distances. In contrast, non-contact atomic force microscopy images show both periodicities only at small tip-sample distances while, unexpectedly, a 3 x 3 superstructure is present at larger tip-sample distances. Using density functional theory calculations, we qualitatively reproduce the experimental findings and indicate that the 3 x 3 superstructure at different tip-sample distances in non-contact atomic force microscopy images is a result from different underlying interactions. In addition, we show that the displacement of the surface-terminating Se atoms has a negligible influence to the contrast in scanning tunneling microscopy images. Our combined experimental and theoretic work presents a method on how to discriminate the influence of the surface corrugation from the variation of the charge density to the charge density wave contrast in scanning probe microscopy images, which can provide insights into the influence of structural disorder to a charge density wave ground state.

Mesoscale and Nanoscale Physics

What problem does this paper attempt to address?

The problem that this paper attempts to solve is: how to distinguish the influence of surface atomic displacement and charge - density waves (CDW) on image contrast in scanning probe microscope (SPM) images. Specifically, the author studied the influence of the displacement of surface - terminated selenium (Se) atoms in 2H - NbSe₂ material on the 3 x 3 CDW contrast.

### Research Background

2H - NbSe₂ is a typical material in which different phases coexist, including the superconducting phase and the nearly commensurate 3 x 3 charge - density wave (CDW) phase. The existence of these phases has aroused interest in understanding the interaction of their physical mechanisms. In particular, the formation mechanism of CDW has been discussed in the past two decades. According to the Peierls model, CDW in one - dimensional materials is caused by electronic instability, which modulates the charge density through electron - phonon coupling and is accompanied by the opening of an energy gap. However, studies have shown that Fermi - surface nesting is not the main cause of CDW formation in 2H - NbSe₂, but momentum - dependent electron - phonon coupling plays a major role.

### Core of the Problem

In scanning tunneling microscopy (STM), due to the measurement principle, the electronic and lattice degrees of freedom are convolved together, which makes it difficult to distinguish structural displacement from spatially varying electronic structures. Therefore, the author hopes to understand the specific influence of the displacement of surface Se atoms on CDW contrast through experimental and theoretical calculations.

### Main Research Contents

1. **Experimental Part**:
- Imaging was carried out using STM and non - contact atomic force microscopy (nc - AFM).
- The relative contributions of the atomic lattice and CDW to image contrast were quantified through distance - dependent current and frequency - shift images.
- It was observed that in nc - AFM images, periodic structures exist simultaneously at different tip - sample distances, and unexpectedly, a 3 x 3 superstructure appears at a larger tip - sample distance.

2. **Theoretical Calculation Part**:
- Scanning tunneling microscopy (STM) and non - contact atomic force microscopy (nc - AFM) images were simulated using density functional theory (DFT).
- By comparing the simulated images with and without surface Se atom displacement, it was found that Se atom displacement has almost no influence on CDW contrast in STM images.
- For nc - AFM images, it was found that at a smaller distance, CDW contrast is mainly dominated by Se atom displacement; while at a larger distance, it is mainly dominated by the interaction between the tip permanent dipole and the potential above the surface.

### Conclusions

By combining experimental and theoretical calculations, the author proposed a method to distinguish the influence of surface undulations on charge - density fluctuation contrast. This method can provide insights into the influence of structural disorder on the CDW ground state. Specifically, the author reached the following conclusions:

- The displacement of surface - terminated Se atoms has almost no influence on CDW contrast in STM images.
- In nc - AFM images, CDW contrast at different tip - sample distances is caused by different underlying interactions.
- These results are helpful for understanding the relationship between surface atomic displacement and charge - density waves, and provide a new perspective for future research.

Through these studies, the author not only revealed the specific influence of surface atomic displacement on CDW imaging, but also provided important clues for understanding the electronic structure and lattice dynamics in complex materials.