Abstract:Integrated photonics has reformed our information society by offering on-chip optical signal synthesis, processing and detection with reduced size, weight and power consumption. As such, it has been successfully established in the near-infrared (NIR) telecommunication bands. With the soaring demand in miniaturized systems for biosensing, quantum information and transportable atomic clocks, extensive endeavors have been stacked on translating integrated photonics into the visible spectrum, i.e. visible-light integrated photonics. Various innovative visible-light integrated devices have been demonstrated, such as lasers, frequency combs, and atom traps, highlighting the capacity and prospect to create chip-based optical atomic clocks that can make timing and frequency metrology ubiquitous. A pillar to the development of visible-light integrated photonics is characterization techniques featuring high frequency resolution and wide spectral coverage, which however remain elusive. Here, we demonstrate a vector spectrum analyzer (VSA) for visible-light integrated photonics, offering spectral bandwidth from 766 to 795 nm and frequency resolution of 415 kHz. The VSA is rooted on a widely chirping, high-power, narrow-linewidth, mode-hop-free laser around 780 nm, which is frequency-doubled from the near-infrared via an efficient, broadband CPLN waveguide. The VSA is further referenced to hyperfine structures of rubidium and potassium atoms, enabling 8.1 MHz frequency accuracy. We apply our VSA to showcase the characterization of loss, dispersion and phase response of passive integrated devices, as well as densely spaced spectra of mode-locked lasers. Combining operation in the NIR and visible spectra, our VSA allows characterization bandwidth exceeding an octave and can be an invaluable diagnostic tool for spectroscopy, nonlinear optical processing, imaging and quantum interfaces to atomic devices.

What problem does this paper attempt to address?

### What problem does this paper attempt to solve? This paper aims to address the issue of characterization techniques in visible light integrated photonics, specifically by developing a Vector Spectrum Analyzer (VSA) capable of achieving high-frequency resolution and wide spectral coverage in the visible spectrum range. Specifically: 1. **Background and Need**: - Integrated photonics has achieved great success in the near-infrared communication band and is widely used in telecommunications, sensing, and computing. - With the increasing demand for miniaturized systems, integrated photonics is gradually expanding into the visible spectrum to meet the needs of applications such as biosensing, quantum information processing, and portable atomic clocks. 2. **Limitations of Existing Technologies**: - Current characterization techniques have limitations in terms of frequency resolution and spectral bandwidth in the visible spectrum range. - Existing methods (such as wavelength-calibrated tunable lasers and Mach-Zehnder interferometers) require separate measurements for each resonance and lack the ability to accurately determine resonance frequencies. - The cut-back method, while capable of assessing optical loss, has low precision and is not suitable for cavity structures. 3. **Proposed New Method**: - The paper presents a broadband, high-resolution Vector Spectrum Analyzer (VSA) operating in the wavelength range of 766 to 795 nanometers. - This VSA is based on a broadband, high-power, narrow-linewidth, mode-hop-free laser source, which frequency-doubles near-infrared laser light to the visible spectrum through an efficient broadband CPLN waveguide. - The VSA achieves an absolute frequency reference through the hyperfine structure of rubidium and potassium atoms, achieving a frequency accuracy of 8.1 MHz. 4. **Application Scenarios**: - This VSA can be used to characterize the loss, dispersion, and phase response of passive integrated devices such as silicon nitride microrings. - It can also be used to measure the dense spectrum of mode-locked lasers. Through this technology, researchers can achieve wide spectral bandwidth characterization from near-infrared to visible spectrum, providing valuable diagnostic tools for spectroscopy, nonlinear optical processing, imaging, and quantum interfaces.

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