Quantitative determination of twist angle and strain in Van der Waals moiré superlattices

Steven J. Tran,Jan-Lucas Uslu,Mihir Pendharkar,Joe Finney,Aaron L. Sharpe,Marisa Hocking,Nathan J. Bittner,Kenji Watanabe,Takashi Taniguchi,Marc A. Kastner,Andrew J. Mannix,David Goldhaber-Gordon
2024-06-13
Abstract:Scanning probe techniques are popular, non-destructive ways to visualize the real space structure of Van der Waals moirés. The high lateral spatial resolution provided by these techniques enables extracting the moiré lattice vectors from a scanning probe image. We have found that the extracted values, while precise, are not necessarily accurate. Scan-to-scan variations in the behavior of the piezos which drive the scanning probe, and thermally-driven slow relative drift between probe and sample, produce systematic errors in the extraction of lattice vectors. In this Letter, we identify the errors and provide a protocol to correct for them. Applying this protocol to an ensemble of ten successive scans of near-magic-angle twisted bilayer graphene, we are able to reduce our errors in extracting lattice vectors to less than 1%. This translates to extracting twist angles with a statistical uncertainty less than 0.001° and uniaxial heterostrain with uncertainty on the order of 0.002%.
Materials Science,Mesoscale and Nanoscale Physics
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