Planar near-field measurements of specular and diffuse reflection of millimeter-wave absorbers

Fumiya Miura,Hayato Takakura,Yutaro Sekimoto,Junji Inatani,Frederick Matsuda,Shugo Oguri,Shogo Nakamura

DOI: https://doi.org/10.1364/AO.531654

2024-08-23

Abstract:Mitigating the far sidelobes of a wide field-of-view telescope is one of the critical issues for polarization observation of the cosmic microwave background. Since even small reflections of stray light at the millimeter-wave absorbers inside the telescope may create nonnegligible far sidelobes, we have developed a method to measure the reflectance of millimeter-wave absorbers, including diffuse reflections. By applying the planar near-field measurement method to the absorbers, we have enabled two-dimensional diffuse-reflection measurements, in addition to characterizing specular reflection. We have measured the reflectance of five samples (TK RAM Large and Small Tiles and Eccosorb AN-72, HR-10, and LS-22) at two angles of incidence in the frequency range from 70 GHz to 110 GHz. Compared with conventional horn-to-horn measurements, we obtained a consistent specular reflectance with a higher precision, less affected by standing waves. We have demonstrated that the angular response and diffuse-to-specular reflectance ratio differ among various materials. The measurements also imply that some absorbers may affect the polarization direction when reflecting the incident waves.

Instrumentation and Methods for Astrophysics