Abstract:Mitigating the far sidelobes of a wide field-of-view telescope is one of the critical issues for polarization observation of the cosmic microwave background. Since even small reflections of stray light at the millimeter-wave absorbers inside the telescope may create nonnegligible far sidelobes, we have developed a method to measure the reflectance of millimeter-wave absorbers, including diffuse reflections. By applying the planar near-field measurement method to the absorbers, we have enabled two-dimensional diffuse-reflection measurements, in addition to characterizing specular reflection. We have measured the reflectance of five samples (TK RAM Large and Small Tiles and Eccosorb AN-72, HR-10, and LS-22) at two angles of incidence in the frequency range from 70 GHz to 110 GHz. Compared with conventional horn-to-horn measurements, we obtained a consistent specular reflectance with a higher precision, less affected by standing waves. We have demonstrated that the angular response and diffuse-to-specular reflectance ratio differ among various materials. The measurements also imply that some absorbers may affect the polarization direction when reflecting the incident waves.

What problem does this paper attempt to address?

### What problems does this paper attempt to solve? This paper aims to solve the problem of measuring the reflection characteristics of millimeter - wave absorbers in far sidelobes, especially for the wide - field - of - view design of telescopes in cosmic microwave background (CMB) polarization observations. Specifically, the paper focuses on the following key issues: 1. **Far sidelobe suppression**: For wide - field - of - view telescopes, especially those used for CMB polarization observations, suppressing far sidelobes is crucial. Even a tiny amount of stray - light reflection can lead to non - negligible far sidelobes, thus affecting the observation accuracy. 2. **Reflection characteristics of millimeter - wave absorbers**: In order to effectively suppress stray light, a detailed understanding of the reflection characteristics of millimeter - wave absorbers, including specular reflection and diffuse reflection, is required. Traditional measurement methods (such as the pyramidal - horn - to - pyramidal - horn method) have limitations and cannot fully characterize these characteristics. 3. **Accurate measurement of reflectivity**: The paper proposes a new planar near - field measurement method, which can measure the reflectivity of millimeter - wave absorbers more accurately, including the two - dimensional diffuse - reflection distribution. This method can reduce the influence of standing waves and provide higher accuracy than traditional methods. 4. **Differences in material characteristics**: Millimeter - wave absorbers made of different materials have significant differences in reflection characteristics, especially in their performance under different incident angles and polarization directions. The paper verifies these differences through experiments and explores their influence on the polarization direction. ### Summary By introducing the planar near - field measurement method, the paper overcomes the shortcomings of existing measurement methods in measuring the reflection characteristics of millimeter - wave absorbers, providing important data support for the design of the next - generation CMB telescopes. This helps to improve the observation accuracy of telescopes, especially when dealing with far sidelobe and stray - light problems.

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